TESC

Patch Clamp Amplifiers – Accessories

  • Model Circuit

Description

Model circuit for verification of double patch configurations. The model circuit connects to two probe inputs, simulating two electrodes measuring from the same cell. Two switches toggle between various conditions typically observed during an electrophysiological experiment.

Connectors:

  • 2x BNC
  • Gold-plated reference pin

Simulated conditions:

  • Open pipette (use for applying a test pulse and for correcting offset potentials):
    • R-Pip = 10 & 20 MΩ
    • C-Pip = 6 pF
  • Cell-attached configuration (use for testing C-Fast Compensation):
    • R-Seal = ∞
    • C-Pip = 6 pF
  • Whole-cell configuration (use for testing C-Slow Compensation and Current Clamp, and for verifying stimulus patterns):
    • R-Ser = 10 & 20 MΩ
    • C-Pip = 6 pF
    • R-Mem = 510 & 520 MΩ
    • C-Mem = 22 pF